Facilities
Low-Temperature Instruments
Cryostats (>1.5 K) for Conductivity Measurements (3)
Cryostats (>0.5 K) for Conductivity Measurements (1)
High-Pressure Clamp Cells (< 15 kbar)
Cryostat for Thermoelectric Power Measurements
Cryostat for Specific Heat Measurements by the Relaxation Method
11 T Magnet with Two-Axis Rotation Equipment
ESR Spectrometer JEOL JES-TE100
X band (9 GHz)
Magnetic Fiels <0.65 T
Temperature 3 to 300 K
Single Crystal Four-Circle X-ray Diffractometer AFC-7R
Semiconductor Analyser Keithley 4200-SCS
Prober Systems (Vacuum and Low Temperature)
Inkjet Printer
Parylene Coater
Step Profiler
Synthetic Laboratory
Mass, IR
Electrochemical Crystal Growth
