Facilities

Low-Temperature Instruments
Cryostats (>1.5 K) for Conductivity Measurements (3)
Cryostats (>0.5 K) for Conductivity Measurements (1)
High-Pressure Clamp Cells (< 15 kbar)
Cryostat for Thermoelectric Power Measurements
Cryostat for Specific Heat Measurements by the Relaxation Method
11 T Magnet with Two-Axis Rotation Equipment

ESR Spectrometer JEOL JES-TE100
X band (9 GHz)
Magnetic Fiels
 <0.65 T
Temperature
 3 to 300 K

Single Crystal Four-Circle X-ray Diffractometer AFC-7R

Semiconductor Analyser Keithley 4200-SCS

scs

Prober Systems (Vacuum and Low Temperature)

scs1

Inkjet Printer

scs2

Parylene Coater

P4060001

Step Profiler

P4060003

Synthetic Laboratory

chem

Mass, IR

P4060004 P4060005

Electrochemical Crystal Growth

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